Time-of-flight secondary ion mass spectrometer

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The TOF is the latest generation of high-end TOF instruments developed over the last 25 years. Its design guarantees optimum performance in all fields of SIMS applications. The flexible, high precision sample manipulator as well as the perfect charge compensation allow the analysis of virtually all kinds of samples, making the TOFthe most flexible Due to the modular design, the instruments can be configured with a selection of optimised ion guns, sample preparation facilities and a variety of special accessories in order to address even the most challenging analytical tasks. The computer control of all instrument functions and parameters ensures ease-of-use and a high level of automation.

Key features

• Ultra-high imaging resolution with the new Bi Nanoprobe
• Outstanding performance for low energy depth profiling
• Unique MCs+ and small area depth profiling capabilities
• Unmatched dynamic range and detection limits
• Sophisticated software for ease of operation and data handling
• Modular construction for configuration and upgrade flexibility
• Ergonomic design with compact footprint