Field Emission Scanning Electron Microscope | Analytical Instruments

Field Emission Scanning Electron Microscope

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  • Field_Emission_Scanning_Electron_Microscope
ICM 27MA

Field Emission Scanning Electron Microscope

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Field emission (FE) electron gun, and now is proud to present a new upgraded FE-EPMA. The FE operates on PC Windows for data acquisition and analysis while maintaining the powerful hardware of the FE including the FE electron gun, EOS, and vacuum system to achieve the ultra micro area analysis. User friendly, PC-based operation facilitate quick and easy analyses at the highest magnifications.

SPECIFICATION

Detectable element range WDS： (Be*) / B～U,EDS: B～U
Detectable X-ray range Detectable wavelength range with WDS : 0.087 to 9.3nm
Detectable energy range with EDS : 20keV
Number of spectrometers WDS: Up to 5 selectable, EDS: 1
Maximum specimen size 100 mm × 100 mm × 50 mm (H)
Accelerating voltage 1 to 30 kV (0.1 kV steps)
Probe current range 10-12 to 5×10-7 A
Probe current stability ± 0.3 % /h
Secondary electron image resolution 3 nm (W.D. 11 mm, 30 kV)
Minimum probe size 40 nm (10 kV, 1×10-8 A)
100 nm (10 kV, 1×10-7 A)
Scanning magnification × 40 to × 300,000 (W. D. 11 mm)
Scanning image resolution Maximum 5,120 × 3,840
Color display For EPMA analysis : LCD 1,280×1,024
For SEM operation and EDS analysis : LCD 1,280×1,024

ANALYTICAL INSTRUMENTS

LABORATORY EQUIPMENTS

CHEMICAL/REAGENTS

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